Mar 18, 2008 18:25
16 yrs ago
2 viewers *
English term
Sub
English to Italian
Tech/Engineering
Electronics / Elect Eng
XXX Partners With YYY to Enable Advanced Process Characterization at ***Sub-65nm***
XXX, a leader in solutions for emerging measurement needs, announces a partnership with YYY, a provider of innovative parametric yield improvement solutions for integrated circuit manufacturers.
...
Parametric process variation at the ***sub-65nm level*** is posing significant challenges to design and test engineers as IC manufacturers seek to produce ever-smaller devices.
grazie
XXX, a leader in solutions for emerging measurement needs, announces a partnership with YYY, a provider of innovative parametric yield improvement solutions for integrated circuit manufacturers.
...
Parametric process variation at the ***sub-65nm level*** is posing significant challenges to design and test engineers as IC manufacturers seek to produce ever-smaller devices.
grazie
Proposed translations
(Italian)
3 +6 | al di sotto (?) | Gianni Pastore |
4 | sotto i 65 nanometri (nm) | 23PaolaV |
Proposed translations
+6
2 mins
Selected
al di sotto (?)
dei 65nm, credo :)
Peer comment(s):
agree |
Federico Zanolla (X)
0 min
|
grazie Morby
|
|
agree |
Maria Rosa Fontana
: :-)
7 mins
|
uelè MR!
|
|
agree |
Maria Luisa Dell'Orto
: Penso proprio di sì :-)
32 mins
|
cheers MLDO :)))
|
|
agree |
Zea_Mays
1 hr
|
grazie Zea!
|
|
agree |
Cristina Lo Bianco
1 hr
|
grazie Cristina!
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|
agree |
Serena Fermo
2 hrs
|
grazie Serena
|
4 KudoZ points awarded for this answer.
Comment: "grazie Gianni, grazie a tutt@, avete fugato il mio dubbio :-)"
12 mins
sotto i 65 nanometri (nm)
il tentativo di mantenere il processo sopra citato al di sotto dei 65 nanometri sta creando sempre nuove e importanti sfide.
Discussion