May 25, 2011 08:02
13 yrs ago
English term
necking error
English to French
Tech/Engineering
Computers (general)
necking error
Errors associated with excessive light, such as bridging, side- lobe or SRAF printing errors, are preferably identified with bright field simulations, while errors associated with insufficient light, such as necking or line-end shortening overlay errors, are preferably identified with dark field simulations.
Necking error ? Merci
Necking error ? Merci
Proposed translations
(French)
| 4 +1 | erreur d'étranglement |
GILLES MEUNIER
|
| 4 | erreur de striction |
FX Fraipont (X)
|
Proposed translations
+1
50 mins
4 KudoZ points awarded for this answer.
Comment: "re -:)"
47 mins
erreur de striction
necking = striction = étranglement
"Design and process integration for microelectronic manufacturing. Conference No3, San Jose CA , ETATS-UNIS (03/03/2005)
2005 , vol. 5756, pp. 39-50[Note(s) : XXXV, 438 p., ] [Document : 12 p.] (16 ref.) ISBN 0-8194-5736-1 ; Illustration : Illustration ;
Langue / Language
Anglais
Editeur / Publisher
Society of Photo-Optical Instrumentation Engineers, Bellingham, WA, INTERNATIONAL (1988) (Revue)
SPIE, Bellingham WA, ETATS-UNIS (2005) (Monographie)
Mots-clés anglais / English Keywords
Proximity effect (lithography)
Timing
Time analysis
Electrical model
System description
Dimensional control
Critical size
Necking
Patterning
Lithography
Integrated circuit manufacture
Design for manufacture
Microelectronic fabrication
Mots-clés français / French Keywords
Effet proximité(lithographie)
Timing
Analyse temporelle
Modèle électrique
Description système
Contrôle dimensionnel
Taille critique
Striction(mécanique)"
http://cat.inist.fr/?aModele=afficheN&cpsidt=17199368
"Design and process integration for microelectronic manufacturing. Conference No3, San Jose CA , ETATS-UNIS (03/03/2005)
2005 , vol. 5756, pp. 39-50[Note(s) : XXXV, 438 p., ] [Document : 12 p.] (16 ref.) ISBN 0-8194-5736-1 ; Illustration : Illustration ;
Langue / Language
Anglais
Editeur / Publisher
Society of Photo-Optical Instrumentation Engineers, Bellingham, WA, INTERNATIONAL (1988) (Revue)
SPIE, Bellingham WA, ETATS-UNIS (2005) (Monographie)
Mots-clés anglais / English Keywords
Proximity effect (lithography)
Timing
Time analysis
Electrical model
System description
Dimensional control
Critical size
Necking
Patterning
Lithography
Integrated circuit manufacture
Design for manufacture
Microelectronic fabrication
Mots-clés français / French Keywords
Effet proximité(lithographie)
Timing
Analyse temporelle
Modèle électrique
Description système
Contrôle dimensionnel
Taille critique
Striction(mécanique)"
http://cat.inist.fr/?aModele=afficheN&cpsidt=17199368
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